View DAC8222_111225.PDF datasheet online --- IC-ON-LINE

Datasheet File OCR Text:

a
FEATURES Two Matched 12-Bit DACs on One Chip Direct Parallel Load of All 12 Bits for High Data Throughput Double-Buffered Digital Inputs 12-Bit Endpoint Linearity ( 1/2 LSB) Over Temperature +5 V to +15 V Single Supply Operation DACs Matched to 1% Max Four-Quadrant Multiplication Improved ESD Resistance Packaged in a Narrow 0.3" 24-Lead DIP and 0.3" 24- Lead SOL Package Available in Die Form APPLICATIONS Automatic Test Equipment Robotics/Process Control/Automation Digital Gain/Attenuation Control Ideal for Battery-Operated Equipment
Dual 12-Bit Double-Buffered Multiplying CMOS D/A Converter DAC8222
FUNCTIONAL DIAGRAM
GENERAL DESCRIPTION
The DAC8222 is a dual 12-bit, double-buffered, CMOS digitalto-analog converter. It has a 12-bit wide data port that allows a 12-bit word to be loaded directly. This achieves faster throughput time in stand-alone systems or when interfacing to a 16-bit processor. A common 12-bit input TTL/CMOS compatible data port is used to load the 12-bit word into either of the two DACs. This port, whose data loading is similar to that of a RAM's write cycle, interfaces directly with most 12-bit and 16-bit bus systems. (See DAC8248 for a complete 8-bit data bus interface product.) A common bus allows the DAC8222 to be packaged in a narrow 24-lead 0.3" DIP and save PCB space. The DAC is controlled with two signals, WR and LDAC. With logic low at these inputs, the DAC registers become transparent. This allows direct unbuffered data to flow directly to either DAC output selected by DAC A/DAC B. Also, the DAC's
double-buffered digital inputs will allow both DACs to be simultaneously updated. DAC8222's monolithic construction offers excellent DAC-toDAC matching and tracking over the full operating temperature range. The chip consists of two thin-film R-2R resistor ladder networks, four 12-bit registers, and DAC control logic circuitry. The device has separate reference-input and feedback resistors for each DAC and operates on a single supply from +5 V to +15 V. Maximum power dissipation at +5 V using zero or VDD logic levels is less than 0.5 mW. The DAC8222 is manufactured with highly stable thin-film resistors on an advanced oxide-isolated, silicon-gate, CMOS technology. Improved latch-up resistant design eliminates the need for external protective Schottky diodes.
REV. C
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 World Wide Web Site: http://www.analog.com Fax: 781/326-8703 (c) Analog Devices, Inc., 2000
DAC8222-SPECIFICATIONS
ELECTRICAL CHARACTERISTICS
Parameter STATIC ACCURACY Resolution Relative Accuracy Differential Nonlinearity Full-Scale Gain Error1 Gain Temperature Coefficient Gain/Temperature Output Leakage Current IOUT A (Pin 2), IOUT B (Pin 24) Input Resistance (VREF A, VREF B) Input Resistance Match DIGITAL INPUTS Digital Input High Digital Input Low Input Current Input Capacitance2 POWER SUPPLY Supply Current DC Power Supply Rejection Ratio (Gain/VDD)
(@ VDD = +5 V or +15 V, VREF A = VREF B = +10 V, VOUT A = VOUT B = 0 V; AGND = DGND = 0 V; TA = Full Temperature Range Specified in Absolute Maximum Ratings; unless otherwise noted. Specifications apply for DAC A and DAC B.)
Symbol Conditions N INL DNL GFSE Min 12 DAC8222A/E/G DAC8222F/H All Grades are Guaranteed Monotonic DAC8222A/E DAC8222G DAC8222F/H (Notes 2, 7) All Digital Inputs = 0000 0000 0000 (Note 9) TA = +25C TA = Full Temp. Range 8 2 5 11 0.2 Endpoint Linearity Error Typ Max Units Bits LSB LSB LSB LSB LSB LSB ppm/C nA nA k %
1/2 1 1 1 2 4 5 10 50 15 1
TCGFS ILKG RREF RREF RREF VINH VINL IIN CIN
VDD = +5 V VDD = +15 V VDD = +5 V VDD = +15 V VIN = 0 V or VDD TA = +25C TA = Full Temp. Range and VINL or VINH DB0-DB11 WR, LDAC, DAC A/DAC B All Digital Inputs VINL or VINH All Digital Inputs 0 V or VDD VDD = 5%
2.4 13.5 0.001 0.8 1.5 1 10 10 15 2 100 0.002
V V V V A A pF pF mA A %/%
IDD PSRR
10
AC PERFORMANCE CHARACTERISTICS2 Propagation Delay4, 5 tPD TA = +25C tS TA = +25C Current Settling Time5, 6 Digital Inputs = All 0s Output Capacitance CO COUT A, COUT B Digital Inputs = All 1s COUT A, COUT B VREF A to IOUT A; VREF A = 20 V p-p; AC Feedthrough at FTA f = 100 kHz; TA = +25C IOUT A or IOUT B VREF B to IOUT B; VREF B = 20 V p-p; FTB f = 100 kHz; TA = +25C SWITCHING CHARACTERISTICS2, 3 DAC Select to Write Set-Up Time DAC Select to Write Hold Time LDAC to Write Set-Up Time LDAC to Write Hold Time Data Valid to Write Set-Up Time Data Valid to Write Hold Time Write Pulse Width LDAC Pulse Width tAS tAH tLS tLH tDS tDH tWR tLWD +25C 150 0 80 20 220 0 130 100
16 17
350 1 90 90 120 120 -70 -70 -70 -70
ns s pF pF pF pF dB dB dB dB
VDD = +5 V VDD = +15 V -40C to +85C8 -55C to +125C All Temps10 180 210 60 0 100 20 240 0 160 120 0 120 20 260 0 170 130 0 60 20 100 10 90 60
ns min ns min ns min ns min ns min ns min ns min ns min
NOTES 11 Measured using internal RFB A and RFB B. Both DAC digital inputs = 1111 1111 1111. 12 Guaranteed and not tested. 13 See timing diagram. 14 From 50% of digital input to 90% of final analog output current. VREF A = VREF B = +10 V; OUT A, OUT B load = 100 , CEXT = 13 pF. 15 WR, LDAC = 0 V; DB0-DB11 = 0 V to VDD or VDD to 0 V.
Settling time is measured from 50% of the digital input change to where the output voltage settles within 1/2 LSB of full scale. Gain TC is measured from +25C to TMIN or from +25C to TMAX. 18 These limits apply for the commercial and industrial grade products. 19 Absolute temperature coefficient is approximately +50 ppm/C. 10 These limits also apply as typical values for V DD = +12 V with +5 V CMOS logic levels and TA = +25C. Specifications subject to change without notice.
-2-
REV. C
DAC8222
ABSOLUTE MAXIMUM RATINGS
(TA = +25C, unless otherwise noted.)
PIN CONNECTIONS 24-Lead 0.3" Cerdip 24-Lead Plastic DIP 24-Lead SOL 28-Terminal LCC
VDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V, +17 V VDD to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0 V, +17 V AGND to DGND . . . . . . . . . . . . . . . . . . -0.3 V, VDD +0.3 V Digital Input Voltage to DGND . . . . . . . -0.3 V, VDD +0.3 V IOUTA, IOUTB to AGND . . . . . . . . . . . . . . -0.3 V, VDD +0.3 V VREFA, VREFB to AGND . . . . . . . . . . . . . . . . . . . . . . . . . 25 V VRFBA, VRFBB to AGND . . . . . . . . . . . . . . . . . . . . . . . . . 25 V Operating Temperature Range AW Version . . . . . . . . . . . . . . . . . . . . . . . -55C to +125C EW, FW, FP Versions . . . . . . . . . . . . . . . . -40C to +85C GP, HP, HS Versions . . . . . . . . . . . . . . . . . . . 0C to +70C Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . +150C Storage Temperature . . . . . . . . . . . . . . . . . . -65C to +150C Lead Temperature (Soldering, 60 sec) . . . . . . . . . . . . +300C Package Type 24-Lead Hermetic DIP (W) 24-Lead Plastic DIP (P) 24-Lead SOL (S)
JA 1 JC
NC = NO CONNECT
Units C/W C/W C/W
69 62 72
10 32 24
NOTE 1 JA is specified for worst-case mounting conditions, i.e., qJA is specified for device in socket for Cerdip, and P-DIP packages; JA is specified for device soldered to printed circuit board for SO package.
CAUTION
1. Do not apply voltages higher than VDD or less than GND potential on any terminal except VREF and RFB. 2. The digital control inputs are Zener-protected; however, permanent damage may occur on unprotected units from high-energy electrostatic fields. Keep units in conductive foam at all times until ready to use. 3. Do not insert this device into powered sockets; remove power before insertion or removal. 4. Use proper antistatic handling procedures. 5. Devices can suffer permanent damage and/or reliability degradation if stressed above the limits listed under Absolute Maximum Ratings for extended periods.
ORDERING GUIDE Model DAC8222EW DAC8222GP DAC8222BTC/883* DAC8222FW DAC8222FP DAC8222FS INL GFSE (LSB) (LSB) 1/2 1/2 1 1 1 1 1 2 4 4 4 4 Temperature Range -40C to +85C 0C to +70C -55C to +125C -40C to +85C -40C to +85C -40C to +85C Package Description Cerdip-24 P-DIP-24 LCC-28 Cerdip-24 P-DIP-24 SOL-24 Package Option Q-24 N-24 E-28A Q-24 N-24 R-24
*Consult factory for DAC8222/883 MIL-STD data sheet.
CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the DAC8222 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
REV. C
-3-
DAC8222
DICE CHARACTERISTICS
11. 12. 13. 14. 15. 16. 17. 18. 19. 10. 11. 12.
AGND IOUT A RFB A VREF A DGND DB11(MSB) DB10 DB9 DB8 DB7 DB6 DB5
13. 14. 15. 16. 17. 18. 19. 20. 21. 22. 23. 24.
DB4 DB3 DB2 DB1 DB0 (LSB) DAC A/DAC B LDAC WR VDD VREF B RFB B IOUT B
Substrate (die backside) is internally connected to VDD.
DIE SIZE 0.124 x 0.132 inch, 16,368 sq. mils (3.15 x 3.55 mm, 10.56 sq. mm)
WAFER TEST LIMITS (@ V
Parameter Relative Accuracy Differential Nonlinearity Full Scale Gain Error1 Output Leakage (IOUT A, IOUT B) Input Resistance (VREF A, VREF B) Input Resistance Match Digital Input High Digital Input Low Digital Input Current Supply Current DC Supply Rejection (Gain/VDD)
DD
= +5 V or +15 V, VREF A = VREF B = +10 V, VOUT A = VOUT B = 0 V; AGND = DGND = 0 V; TA = +25 C)
Conditions Endpoint Linearity Error All Grades are Guaranteed Monotonic Digital Inputs = 1111 1111 1111 Digital Inputs = 0000 0000 0000 Pads 2 and 24 Pads 4 and 22 DAC8222G Limit 1 1 4 50 8/15 1 2.4 13.5 0.8 1.5 1 2 0.1 0.002 Units LSB max LSB max LSB max nA max
Symbol INL DNL GFSE ILKG RREF RREF RREF VINH VINL IIN IDD PSR
k max % max V min V min V max V min A max mA max %/% max
VDD = +5 V VDD = +15 V VDD = +5 V VDD = +15 V VIN = 0 V or VDD; VINL or VINH All Digital Inputs VINL or VINH All Digital Inputs 0 V or VDD VDD = 5%
NOTES 1 Measured using internal R FB A and RFB B. Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
-4-
REV. C
DAC8222
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 1. Channel-to-Channel Matching (DAC A and B are Superimposed)
Figure 2. Differential Nonlinearity vs. VREF
Figure 3. Differential Nonlinearity vs. VREF
Figure 4. Nonlinearity vs. VREF
Figure 5. Nonlinearity vs. VREF
Figure 6. Nonlinearity vs. VDD
Figure 7. Nonlinearity vs. Code (DAC A and B are Superimposed)
Figure 8. Nonlinearity vs. Code at TA = -55C, +25C, +125C for DAC A and B (All Superimposed)
Figure 9. Absolute Gain Error Changes vs. VREF
REV. C
-5-
DAC8222
TYPICAL PERFORMANCE CHARACTERISTICS
Figure 10. Full-Scale Gain Error vs. Temperature
Figure 11. Logic Input Threshold Voltage vs. Supply Voltage (VDD)
Figure 12. Supply Current vs. Temperature
Figure 13. Supply Current vs. Logic Input Voltage
Figure 14. Multiplying Mode Frequency Response vs. Digital Code
Figure 15. Output Leakage Current vs. Temperature
Figure 16. Analog Crosstalk vs. Frequency
Figure 17. Interface Timing vs. VDD
-6-
REV. C
DAC8222
Figure 18. Burn-In Circuit
PARAMETER DEFINITIONS
RESOLUTION (n)
The resolution of a DAC is the number of states (2n) into which the full-scale range (FSR) is divided (or resolved); where n is equal to the number of bits.
RELATIVE ACCURACY (INL)
Relative accuracy, or integral nonlinearity, is the maximum deviation of the analog output (from the ideal) from a straight line drawn between the end points. It is expressed in terms of least significant bit (LSB), or as a percent of full scale.
DIFFERENTIAL NONLINEARITY (DNL)
Figure 19. Simplified Single DAC Circuit Configuration. (Switches Are Shown for All Digital Inputs at Zero)
Differential nonlinearity is the worst case deviation of any adjacent analog output from the ideal 1 LSB step size. The deviation of the actual "step size" from the ideal step size of 1 LSB is called the differential nonlinearity error or DNL. DACs with DNL greater than 1 LSB may be nonmonotonic 1/2 LSB INL guarantees monotonicity and 1 LSB maximum DNL.
GAIN ERROR (GFSE)
Gain error is the difference between the actual and the ideal analog output range, expressed as a percent of full-scale or in terms of LSB value. It is the deviation in slope of the DAC transfer characteristic from ideal. See Orientation in Digital-to-Analog Converters Section of the current data book, for additional parameter definitions.
Figure 20. N-Channel Current Steering Switch
GENERAL CIRCUIT DESCRIPTION
CONVERTER SECTION
Figure 19 shows a simplified circuit for the R-2R ladder network and transistor switches for one DAC. R is typically 11 k. The transistor switches are binarily scaled in size to maintain a constant voltage drop across each switch. Figure 20 shows a single NMOS transistor switch. The binary-weighted currents are switched between IOUT and AGND by the N-channel MOS transistor switches. The selection between IOUT and AGND is determined by the digital input code. It is important to note here that the voltage difference
The DAC8222 contains four 12-bit registers (two input registers and two DAC registers), two highly stable thin-film R-2R resistor ladder networks, and interface control logic circuitry. Also included are 24 single-pole, double-throw, NMOS transistor current switches.
REV. C
-7-
DAC8222
between IOUT and AGND terminals be as close to zero as practical in order to keep DAC errors to a minimum. This is normally done by connecting AGND to the noninverting input of an op amp and IOUT to the inverting input. The DAC's internal resistor (RFB) can be used for the feedback resistor by connecting the op amp's output directly to the DAC's RFB terminal. The op amp also provides the current-to-voltage conversion for the DAC's output current. The output voltage is dependent on the DAC's digital input code and VREF, and is given by: VOUT = -VREF x D/4096 where D is the digital input code integer number that is between 0 and 4095. The DAC's input resistance, VREF (Figure 19), is always equal to a constant value, R. This means that VREF can be driven by a reference voltage or current, ac or dc (positive or negative). It is recommended that a low-temperature-coefficient external RFB resistor be used if a current source is employed. The DAC's output capacitance (COUT) is code dependent and varies from 90 pF (all digital inputs low) to 120 pF (all digital inputs high). Figure 19 shows a transistor switch in series with the R-2R ladder terminating resistor and RFB resistor. They were designed into the DAC to binarily match the ladder leg switches and improve power supply rejection and gain error temperature coefficient. The gates of these transistor switches are connected to VDD, so that an "open-circuit" exists when VDD is not applied. This means that an op amp's output voltage will go to either "rail" if powered up before the DAC. Also, RFB resistance cannot be measured without VDD being applied.
DIGITAL SECTION
The DAC8222's digital inputs are CMOS inserters. They were designed to convert TTL and CMOS input logic levels into voltage levels to drive the internal circuitry. The digital inputs are TTL compatible at VDD = +5 V and CMOS compatible at VDD = +15 V. The DAC8222 can use +5 V CMOS logic levels with VDD = +12 V; however, supply current will rise to approximately 5 mA-6 mA. Figure 21 shows the DAC's digital input register structure for one bit. This circuit drives the DAC register. Digital controls and shown are generated from DAC A/DAC B and WR control signals. As shown in Figure 21, these inputs are electrostatic-discharge protected with two internal distributed diodes; they are connected between VDD and DGND. Each digital input has a typical input current of less than 1 nA. When the digital inputs are in the region of +1.2 V to +2.8 V (peaking at +1.8 V) using a +5 V power supply or in the region of +1.7 V to +12 V (peaking at +3.9 V) with a +15 V power supply, the input register transistors are operating in their linear region and draw current from the power supply. It is therefore, recommended that the digital input voltages be as close to the supply rails (VDD and DGND) as is practically possible to keep supply currents at a minimum. The DAC8222 may be operated with any supply voltage between the range of +5 V to +15 V.
INTERFACE CONTROL LOGIC
The DAC8222's input control logic circuitry is shown in Figure 22. Note how the WR signal is used in conjunction with DAC A/ DAC B to load data into either input register. LDAC loads data from the input registers to the DAC register; the DAC's analog output voltage is determined by the data contained in each DAC register. The truth table for the DAC registers is shown in the Mode Selection Table. Note how the input register is transparent when WR is low and LDAC is high, and that the DAC register is transparent when WR is high and LDAC is low (LDAC updates the DAC's analog output voltage). The DAC is transparent from input to output when WR and LDAC are both low, and the DAC is latched (input and output is not being updated) when WR and LDAC are both high.
Figure 21. Digital Input Structure For One Bit
Figure 22. Input Control Logic
-8-
REV. C
DAC8222
Table I. Mode Selection
Digital Inputs DAC A/B L H L H X X WR L L L L H H LDAC L L H H L H
Register Status DAC A DAC B Input Register DAC Register Input Register DAC Register WRITE LATCHED WRITE LATCHED LATCHED LATCHED WRITE WRITE LATCHED LATCHED WRITE LATCHED LATCHED WRITE LATCHED WRITE LATCHED LATCHED WRITE WRITE LATCHED LATCHED WRITE LATCHED
L = Low, H = High, X = Don't Care
INTERFACE CONTROL LOGIC
WRITE TIMING CYCLES
DAC A/DAC B (Pin 18)-DAC Selection. Active low for DAC A and active high for DAC B. WR (Pin 20)-WRITE. Active Low. Used to write data into either DAC A or DAC B input registers, or active high latches data into the input registers. LDAC (Pin 19)-LOAD DAC. Active Low. Used to simultaneously transfer data from DAC A and DAC B input registers to both DAC outputs. The DAC becomes transparent (activity on the digital inputs appear at the analog output) when both WR and LDAC are low. Data is latched into the output registers on the rising edge of LDAC.
Two timing diagrams are shown and are at the user's discretion which to use. The TWO-CYCLE UPDATE, as the name implies, allows both DAC registers to be loaded and the outputs updated in two cycles. Data is first loaded into one DAC's input register on the first write cycle, and then new data loaded into the other DAC's input register while simultaneously updating both DAC outputs on the second cycle. The THREE-CYCLE UPDATE allows DAC A and DAC B registers to be loaded and analog output to be updated at a later time. The first two cycles load both DACs as above, and the third cycle updates the outputs. The LDAC and DAC A/DAC B control pins can be tied together and controlled with a single strobe. When using the DAC in this configuration, DAC B must be loaded first.
Two-Cycle Update
Three-Cycle Update Figure 23. Write Cycle Timing Diagram
REV. C
-9-
DAC8222
* RESISTORS R1 THROUGH R4 ARE ONLY NECESSARY TO TRIM FOR ABSOLUTE ACCURACY BETTER THAN 0.01%, SEE TEXT FOR COMPLETE DETAILS. ** REGISTERS AND CONTROL CIRCUITRY OMITTED FOR SIMPLICITY.
Figure 24. Unipolar Configuration (Two-Quadrant Multiplication)
APPLICATIONS INFORMATION
UNIPOLAR OPERATION
Table II. Unipolar Binary Code Table (Refer to Figure 24)
Figure 24 shows a simple unipolar (2-quadrant multiplication) circuit using the DAC8222 and OP270 dual op amp (use two OP42s for higher speeds), and Table II the corresponding code table. Resistors R1, R2, and R3, R4 are used only if full-scale gain adjustments are required. Low temperature coefficient (approximately 50 ppm/C) resistors or trimmers should be used. Maximum full-scale error without these resistors for the top grade device and VREF = 10 V is 0.024% and 0.097% for the low grade. C1 and C2 provide phase compensation to help reduce overshoot and ringing when high speed op amps are used. Full-scale adjustment is accomplished by loading the digital inputs with all 1s and adjusting R1 (or R3) so that
4095 VOUT = VREF x 4096
Binary Number in DAC Register MSB LSB 1111 1111 1111 1000 0000 0000 0000 0000 0001 0000 0000 0000
NOTE 1 LSB = (2-12) (VREF) =
Analog Output, VOUT (DAC A or DAC B) -VREF 4096 -VREF = -1/2 VREF 4096 -VREF 4096 0V
1 4096
(VREF)
4095 2048 1
Full-scale can also be adjusted by varying VREF voltage, thus eliminating R1, R2, R3 and R4. Zero adjustment is performed by setting the DAC's digital inputs to all 0s and adjusting the op amp's offset adjust so that VOUT = 0 V. To maintain monotonicity and minimize gain and linearity errors, it is recommended that the op amp offset voltage be adjusted to less than 10% of 1 LSB (244 V) over the operating temperature range of interest.
BIPOLAR OPERATION
The bipolar (offset binary) four-quadrant operation configuration using the DAC8222 is shown in Figure 25 and the corresponding code in Table III. The circuit makes use of the OP470 a quad op amp (use four OP42s for higher speeds). Resistors R1, R2, R3, and R4 may be omitted and full-scale output voltage may be adjusted by varying VREF or the value of R5 and R8. If resistors R1, R2, R3, and R4 are omitted,
-10-
REV. C
DAC8222
Figure 25. Bipolar Configuration (Four-Quadrant Multiplication)
Table III. Bipolar (Offset Binary) Code Table (Refer to Figure 25)
Binary Number in DAC Register MSB LSB 1111 1111 1111 1000 0000 0001 1000 0000 0000 0111 1111 1111 0000 0000 0000
NOTE 1 LSB = (2-11) (VREF) =
Analog Output, VOUT (DAC A or DAC B) +VREF +VREF 0V -VREF 2048 -VREF 2048
1 2048
(VREF)
resistors R5, R6, R7, should be ratio-matched to 0.01% so that gain error meets data sheet specifications. (Corresponding resistors, R8, R9, and R10 for DAC B should also be matched to 0.01%). The resistors should have identical temperature coefficients if operating over the full temperature range. Zero and full-scale are adjusted one of two ways and are at the user's discretion. Zero-output can be adjusted by first setting the digital inputs to 1000 0000 0000 and adjusting R1 (R3 for DAC B) so that VOUTA (or VOUT B) equals 0 V. If R1, R2 (R3, R4 for DAC B) are omitted, then VOUT = 0 V can be adjusted by varying R6, R7 (R9, R10 for DAC B) ratios. Full-scale is adjusted by setting the digital inputs to 1111 1111 1111 and varying R5 (R8 for DAC B). Full-scale can also be adjusted by varying VREF. Full-scale output is equal to VREF minus one LSB.
2047 2048 1 2048
1 2048
REV. C
-11-
DAC8222
Figure 26. Single Supply Operation (Current Switching Mode)
SINGLE SUPPLY OPERATION
CURRENT STEERING MODE
APPLICATIONS TIPS
GENERAL GROUND MANAGEMENT
Because the DAC8222's R-2R resistor ladder terminating resistor is internally connected to AGND, it lends itself well to single supply operation in the current steering mode. This means that AGND can be raised above system ground as shown in Figure 26. The output voltage range will be from +5 V to +10 V depending on the digital input code and is given by: VOUT = VOS + (n/4096) (VOS) where VOS = Offset Reference Voltage (+5 V in Figure 26) where n = Decimal Equivalent of the Digital Input Word
VOLTAGE SWITCHING MODE
Grounding techniques should be tailored to each individual system. Ground loops should be avoided, and ground current paths should be as short as possible and have a low impedance. The DAC8222's AGND and DGND pins should be tied together at the device socket to prevent digital transients from appearing at the analog output. This common point then becomes the single ground point connection. AGND and DGND should then be brought out separately and tied to their respective power supply grounds. Ground loops can be created if both grounds are tied together at more than one location, i.e., tied together at the device and at the digital and analog power supplies. A PC board ground plane can be used for the single point ground connection should the connections not be practical at the device socket. If neither of these connections is practical or allowed, the device should be placed as close as possible to the system's single point ground connection. Back-to-back Schottky diodes should then be connected between AGND and DGND.
POWER SUPPLY DECOUPLING
Figure 27 shows the DAC8222 in a single supply voltage switching mode of operation. In this configuration, the DAC's R-2R ladder acts as a voltage divider. The output voltage at the VREF pin exhibits a constant impedance R (typically 11 k) and must be buffered by an op amp. RFB pins are not used in this circuit configuration. The reference input voltage must be maintained within +1.25 V of AGND and VDD from +12 V to +15 V to preserve device accuracy. The output voltage expression is given by: VOUT = VREF (n/4096) where n = Decimal Equivalent of the Digital Input Word
Power supplies used with the DAC8222 should be well filtered and regulated. Local supply decoupling consisting of a 1 F to 10 F tantalum capacitor in parallel with a 0.1 F ceramic is highly recommended. The capacitors should be connected between the VDD and DGND pins and at the device socket.
-12-
REV. C
DAC8222
Figure 27. Single Supply Operation (Voltage Switching Mode)
Figure 28. Digitally-Programmable Window Detector (Upper/Lower Limit Detector)
BASIC APPLICATIONS
PROGRAMMING WINDOW DETECTOR
MICROPROCESSOR INTERFACE CIRCUITS
Figure 28 shows the DAC8222 used in a programmable window detector configuration. The required upper and lower limits for the test are loaded into DAC A and DAC B. If a signal at the test input is not within the programmed limits, the output will indicate a logic zero.
The DAC8222's versatile loading structure greatly simplifies interfacing to 16-bit bus systems; it also reduces the number of "glue" logic components. Data loading into its 12-bit wide data input is achieved by use of only two control signals, WR and LDAC. DAC selection is controlled with a single DAC A/DAC B line. Figures 29 and 30 show how easily the DAC8222 interfaces with the 8086 and 68000 16-bit microprocessors.
REV. C
-13-
DAC8222
Figure 29. DAC8222 to 8086 Interface
Figure 30. DAC8222 to 68000 Interface
-14-
REV. C
OUTLINE DIMENSIONS
Dimensions shown in inches and (mm).
0.005 (0.13) MIN
24
0.098 (2.49) MAX
13
1
0.310 (7.87) 0.220 (5.59)
12
0.100 (2.54) 0.064 (1.63) 0.095 (2.41) 0.075 (1.90) 0.011 (0.28) 0.007 (0.18) R TYP 0.075 (1.91) REF 0.088 (2.24) 0.054 (1.37)
0.075 (1.91) REF
26 25
0.300 (7.62) BSC 0.150 (3.51) BSC
4 28 1 5
0.015 (0.38) MIN 0.028 (0.71) 0.022 (0.56) 0.050 (1.27) BSC
11 12
PIN 1 1.280 (32.51) MAX 0.200 (5.08) MAX 0.200 (5.08) 0.125 (3.18) 0.023 (0.58) 0.014 (0.36) 0.100 (2.54) BSC 0.060 (1.52) 0.015 (0.38) 0.150 (3.81) MIN 0.070 (1.78) SEATING 0.030 (0.76) PLANE
0.320 (8.13) 0.290 (7.37)
0.458 (11.63) 0.442 (11.23) 0.458 SQ (11.63) MAX SQ
BOTTOM VIEW
19 18
15 0
0.015 (0.38) 0.008 (0.20)
0.055 (1.40) 0.045 (1.14)
0.200 (5.08) BSC
45 TYP
24-Lead Plastic DIP (N-24)
1.275 (32.30) 1.125 (28.60)
24 1 13 12
24-Lead Wide-Body SOL (R-24)
0.6141 (15.60) 0.5985 (15.20)
0.280 (7.11) 0.240 (6.10) 0.325 (8.25) 0.300 (7.62) 0.195 (4.95) 0.115 (2.93) 0.015 (0.381) 0.008 (0.204)
PIN 1
24
13
PIN 1 0.210 (5.33) MAX 0.200 (5.05) 0.125 (3.18) 0.022 (0.558) 0.014 (0.356) 0.100 (2.54) BSC 0.060 (1.52) 0.015 (0.38) 0.150 (3.81) MIN 0.070 (1.77) SEATING 0.045 (1.15) PLANE
0.2992 (7.60) 0.2914 (7.40)
1 12
0.4193 (10.65) 0.3937 (10.00)
0.1043 (2.65) 0.0926 (2.35)
0.0291 (0.74) 0.0098 (0.25)
45
0.0118 (0.30) 0.0500 0.0040 (0.10) (1.27) BSC
8 0 0.0192 (0.49) SEATING 0.0125 (0.32) PLANE 0.0138 (0.35) 0.0091 (0.23)
0.0500 (1.27) 0.0157 (0.40)
REV. C
-15-
PRINTED IN U.S.A.
C3123-0-5/00 (rev. C) 00459
24-Lead Cerdip (Q-24)
28-Terminal Leadless Ceramic Chip Carrier (E-28A)

▲Up To Search▲

Price & Availability of DAC8222

	To Download DAC8222 Datasheet File
If you can't view the Datasheet, Please click here to try to view without PDF Reader .